TY - GEN
T1 - Stacklock with simple FSM
AU - Ahn, Dongkyun
AU - Lee, Gyungho
PY - 2009
Y1 - 2009
N2 - With a wide spread of malicious software attacks, run-time stack has been drawing attention because it is one of the most vulnerable points in computer architecture. Conventional stack layout, in which local variables for user input and control ow data such as return address are saved close to each other, is often the root of the attack vulnerability. This paper proposes a simple ?nite state machine to track usage of stack frame locations at a ?ne granularity of 2-bytes. Such a ?ne grain protection is necessary to distinguish adjacent stack frame locations, which allows detecting abnormal memory operations even in real mode running of a boot loader. The proposed scheme guarantees 2-byte granularity for preventing malicious writes in the stack using small additional memory space for the ?nite state machine.1
AB - With a wide spread of malicious software attacks, run-time stack has been drawing attention because it is one of the most vulnerable points in computer architecture. Conventional stack layout, in which local variables for user input and control ow data such as return address are saved close to each other, is often the root of the attack vulnerability. This paper proposes a simple ?nite state machine to track usage of stack frame locations at a ?ne granularity of 2-bytes. Such a ?ne grain protection is necessary to distinguish adjacent stack frame locations, which allows detecting abnormal memory operations even in real mode running of a boot loader. The proposed scheme guarantees 2-byte granularity for preventing malicious writes in the stack using small additional memory space for the ?nite state machine.1
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U2 - 10.1109/EIT.2009.5189582
DO - 10.1109/EIT.2009.5189582
M3 - Conference contribution
AN - SCOPUS:70449370162
SN - 9781424433551
T3 - Proceedings of 2009 IEEE International Conference on Electro/Information Technology, EIT 2009
SP - 46
EP - 51
BT - Proceedings of 2009 IEEE International Conference on Electro/Information Technology, EIT 2009
T2 - 2009 IEEE International Conference on Electro/Information Technology, EIT 2009
Y2 - 7 June 2009 through 9 June 2009
ER -