TY - GEN
T1 - Static and low frequency noise characterization of densely packed CNT-TFTs
AU - Joo, Min Kyu
AU - Kim, Un Jeong
AU - Jeon, Dae Young
AU - Park, So Jeong
AU - Mouis, Mireille
AU - Kim, Gyu Tae
AU - Ghibaudo, Gerard
PY - 2012
Y1 - 2012
N2 - Static and low frequency noise (LFN) characterrizations in densely packed single-walled carbon nanotube thin film transistors (CNT-TFTs) are presented. To this end, the Y function method (YFM) is employed for parameter extraction in order to alleviate the influence of the channel access resistance. The low field mobility (μ0), threshold voltage (Vth), mobility attenuation factor (θ) and on/off current ratio have been evaluated with respect to gate mask length (Lmask). The 1/f behavior of LFN has been interpreted with the carrier number and correlated mobility fluctuation model (CNF-CMF). A detailed analysis of the defect density surrounding the surface of carbon nanotube and the Coulomb scattering parameter has also been performed.
AB - Static and low frequency noise (LFN) characterrizations in densely packed single-walled carbon nanotube thin film transistors (CNT-TFTs) are presented. To this end, the Y function method (YFM) is employed for parameter extraction in order to alleviate the influence of the channel access resistance. The low field mobility (μ0), threshold voltage (Vth), mobility attenuation factor (θ) and on/off current ratio have been evaluated with respect to gate mask length (Lmask). The 1/f behavior of LFN has been interpreted with the carrier number and correlated mobility fluctuation model (CNF-CMF). A detailed analysis of the defect density surrounding the surface of carbon nanotube and the Coulomb scattering parameter has also been performed.
UR - http://www.scopus.com/inward/record.url?scp=84870613821&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84870613821&partnerID=8YFLogxK
U2 - 10.1109/ESSDERC.2012.6343350
DO - 10.1109/ESSDERC.2012.6343350
M3 - Conference contribution
AN - SCOPUS:84870613821
SN - 9781467317078
T3 - European Solid-State Device Research Conference
SP - 129
EP - 132
BT - 2012 Proceedings of the European Solid-State Device Research Conference, ESSDERC 2012
T2 - 42nd European Solid-State Device Research Conference, ESSDERC 2012
Y2 - 17 September 2012 through 21 September 2012
ER -