Static and low frequency noise characterization of densely packed CNT-TFTs

Min Kyu Joo, Un Jeong Kim, Dae Young Jeon, So Jeong Park, Mireille Mouis, Gyu Tae Kim, Gerard Ghibaudo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Static and low frequency noise (LFN) characterrizations in densely packed single-walled carbon nanotube thin film transistors (CNT-TFTs) are presented. To this end, the Y function method (YFM) is employed for parameter extraction in order to alleviate the influence of the channel access resistance. The low field mobility (μ0), threshold voltage (Vth), mobility attenuation factor (θ) and on/off current ratio have been evaluated with respect to gate mask length (Lmask). The 1/f behavior of LFN has been interpreted with the carrier number and correlated mobility fluctuation model (CNF-CMF). A detailed analysis of the defect density surrounding the surface of carbon nanotube and the Coulomb scattering parameter has also been performed.

Original languageEnglish
Title of host publication2012 Proceedings of the European Solid-State Device Research Conference, ESSDERC 2012
Pages129-132
Number of pages4
DOIs
Publication statusPublished - 2012
Event42nd European Solid-State Device Research Conference, ESSDERC 2012 - Bordeaux, France
Duration: 2012 Sept 172012 Sept 21

Publication series

NameEuropean Solid-State Device Research Conference
ISSN (Print)1930-8876

Other

Other42nd European Solid-State Device Research Conference, ESSDERC 2012
Country/TerritoryFrance
CityBordeaux
Period12/9/1712/9/21

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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