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Static electrical characterization and low frequency noise of a-InHfZnO thin film transistors
So Jeong Park, Dae Young Jeon, Seung Eon Ahn, Sanghun Jeon, Laurent Montès, Gyu Tae Kim, Gérard Ghibaudo
Research output: Contribution to journal › Article › peer-review
21
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(Scopus)