Static electrical characterization and low frequency noise of a-InHfZnO thin film transistors

Keyphrases

• Electrical Characterization 100%
• Thin-film Transistors 100%
• Low-frequency Noise 100%
• Static Characteristics 50%
• Numerical Model 16%
• Electrical Properties 16%
• Low Temperature 16%
• Effective Mobility 16%
• Gate Capacitance 16%
• Oxide Layer 16%
• Capacitance-voltage 16%
• Interface Traps 16%
• Channel Layer 16%
• Carrier Trapping 16%
• Bulk Traps 16%
• Detrapping 16%
• Transfer Curves 16%
• Noise Measurement 16%
• Transfer Gate 16%
• Amorphous Oxide Thin-film Transistors 16%
• Y-function 16%
• Inversion Layer 16%
• Band Tail States 16%

Engineering

• Thin-Film Transistor 100%
• Frequency Noise 100%
• Static Characteristic 42%
• Characteristic Frequency 28%
• Experimental Result 14%
• Numerical Model 14%
• Low-Temperature 14%
• Good Agreement 14%
• Oxide Layer 14%
• Channel Layer 14%
• Oxide Semiconductor 14%
• Measurement Noise 14%
• Amorphous Oxide 14%
• Band Tail 14%
• Interface Trap 14%

Material Science

• Thin-Film Transistor 100%
• Oxide Compound 14%
• Oxide Semiconductor 14%
• Capacitance 14%