Stochastic estimation of voltage sags in a large meshed network

Chang Hyun Park; Gilsoo Jang

doi:10.1109/TPWRD.2006.886795

Stochastic estimation of voltage sags in a large meshed network

Chang Hyun Park, Gilsoo Jang

School of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

160 Citations (Scopus)

Abstract

This paper presents a method for stochastic prediction of voltage sags caused by faults in a power system. The area of vulnerability must be determined to estimate the expected sag frequency (ESF) at a sensitive load site. However, the area of vulnerability is not easy to identify in a large meshed network. In the paper, the residual phase voltage equations for balanced and unbalanced faults are presented, and an efficient method to determine the area of vulnerability in a large meshed network is described. An ESF estimation method based on Information Technology Industry Council (ITIC) curve is also described. The developed method was applied to the IEEE 30-bus test system.

Original language	English
Pages (from-to)	1655-1664
Number of pages	10
Journal	IEEE Transactions on Power Delivery
Volume	22
Issue number	3
DOIs	https://doi.org/10.1109/TPWRD.2006.886795
Publication status	Published - 2007

Keywords

Area of vulnerability
Power quality
Stochastic assessment
Voltage sags

ASJC Scopus subject areas

Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1109/TPWRD.2006.886795

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title = "Stochastic estimation of voltage sags in a large meshed network",

abstract = "This paper presents a method for stochastic prediction of voltage sags caused by faults in a power system. The area of vulnerability must be determined to estimate the expected sag frequency (ESF) at a sensitive load site. However, the area of vulnerability is not easy to identify in a large meshed network. In the paper, the residual phase voltage equations for balanced and unbalanced faults are presented, and an efficient method to determine the area of vulnerability in a large meshed network is described. An ESF estimation method based on Information Technology Industry Council (ITIC) curve is also described. The developed method was applied to the IEEE 30-bus test system.",

keywords = "Area of vulnerability, Power quality, Stochastic assessment, Voltage sags",

author = "Park, {Chang Hyun} and Gilsoo Jang",

note = "Funding Information: Manuscript received February 23, 2006. This work was supported by the ERC Program of MOST/KOSEF (Next-Generation Power Technology Center). Paper no. TPWRD-00087-2006. The authors are with the Next-Generation Power Technology Center and the School of Electrical Engineering, Korea University, Seoul 136-701, Korea (e-mail: chpark@korea.ac.kr; gjang@korea.ac.kr). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TPWRD.2006.886795",

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AU - Park, Chang Hyun

AU - Jang, Gilsoo

N1 - Funding Information: Manuscript received February 23, 2006. This work was supported by the ERC Program of MOST/KOSEF (Next-Generation Power Technology Center). Paper no. TPWRD-00087-2006. The authors are with the Next-Generation Power Technology Center and the School of Electrical Engineering, Korea University, Seoul 136-701, Korea (e-mail: chpark@korea.ac.kr; gjang@korea.ac.kr). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TPWRD.2006.886795

PY - 2007

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N2 - This paper presents a method for stochastic prediction of voltage sags caused by faults in a power system. The area of vulnerability must be determined to estimate the expected sag frequency (ESF) at a sensitive load site. However, the area of vulnerability is not easy to identify in a large meshed network. In the paper, the residual phase voltage equations for balanced and unbalanced faults are presented, and an efficient method to determine the area of vulnerability in a large meshed network is described. An ESF estimation method based on Information Technology Industry Council (ITIC) curve is also described. The developed method was applied to the IEEE 30-bus test system.

AB - This paper presents a method for stochastic prediction of voltage sags caused by faults in a power system. The area of vulnerability must be determined to estimate the expected sag frequency (ESF) at a sensitive load site. However, the area of vulnerability is not easy to identify in a large meshed network. In the paper, the residual phase voltage equations for balanced and unbalanced faults are presented, and an efficient method to determine the area of vulnerability in a large meshed network is described. An ESF estimation method based on Information Technology Industry Council (ITIC) curve is also described. The developed method was applied to the IEEE 30-bus test system.

KW - Area of vulnerability

KW - Power quality

KW - Stochastic assessment

KW - Voltage sags

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JO - IEEE Transactions on Power Delivery

JF - IEEE Transactions on Power Delivery

IS - 3

ER -

Stochastic estimation of voltage sags in a large meshed network

Abstract

Keywords

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