Strain-engineered magnetic anisotropy of GaMnAs ferromagnetic semiconductors

T. Kim, S. J. Chung, D. Y. Shin, I. S. Choi, Sanghoon Lee, X. Liu, J. K. Furdyna

    Research output: Contribution to journalArticlepeer-review

    3 Citations (Scopus)

    Abstract

    A series of GaMnAs epilayers grown on GaInAs buffer layers have been investigated. The concentrations of Mn in the GaMnAs layer and In in the GaInAs layer were varied in the series, for which the tensile strain condition for the GaMnAs layer are systematically changed. The X-ray measurement provided the lattice constants of the layers, from which the stain of the GaMnAs layer was determined. The magneto-transport data revealed in-plane anisotropy in the GaMnAs sample grown on a GaInAs buffer with a low concentration of In. Such in-plan magnetic anisotropy of the GaMnAs layer continuously changed to a vertical magnetic anisotropy when the tensile strain was increased in the sample grown on the GaInAs buffer with a higher In concentration. This experiment clearly demonstrated that the magnetic anisotropy of GaMnAs could be continuously engineered by using the strain introduced by the GaInAs buffer layers.

    Original languageEnglish
    Pages (from-to)829-833
    Number of pages5
    JournalJournal of the Korean Physical Society
    Volume50
    Issue number3
    DOIs
    Publication statusPublished - 2007 Mar

    Keywords

    • Ferromagnetic semiconductor
    • Magnetic anisotropy
    • Magnetoresistance
    • Strain

    ASJC Scopus subject areas

    • General Physics and Astronomy

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