Structural and optical properties of epitaxial ZnO thin films on 4H-SiC (0 0 0 1) substrates prepared by pulsed laser deposition

Engineering & Materials Science

• Pulsed laser deposition 100%
• Optical properties 80%
• Structural properties 70%
• Thin films 61%
• Substrates 45%
• Photoluminescence 26%
• Temperature 22%
• Lattice mismatch 14%
• Atomic force microscopy 10%
• X ray diffraction analysis 10%
• Crystallinity 9%
• Surface morphology 9%
• Crystalline materials 8%
• X ray diffraction 7%

Chemical Compounds

• Pulsed Laser Deposition 85%
• Optical Property 47%
• Liquid Film 31%
• Photoluminescence 24%
• Deposition Technique 17%
• X-Ray Diffraction 16%
• Atomic Force Microscopy 12%
• Crystallinity 12%
• Surface 10%
• Ambient Reaction Temperature 9%