Abstract
We have studied the epitaxial growth and structural properties of single crystal Mn/ Ag multilayers grown on (001) GaAs substrates using transmission electron microscopy. A buffer layer of Ag (001) was grown on a 5 monolayer Fe seed layer on the (001) GaAs substrate before the growth of the multilayers to obtain good quality films. Mn/Ag multilayers show very sharp and coherent interfaces for Mn layer thicknesses up to ≈ 14 monolayers. The structure of Mn in Mn/Ag multilayers depends on the thickness of the Mn layer. An fee precursor structure of Mn is proposed with a lattice parameter of 3.94Â and is expected to be antiferromagnetic.
Original language | English |
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Pages (from-to) | 719-722 |
Number of pages | 4 |
Journal | Journal of Electronic Materials |
Volume | 20 |
Issue number | 7 |
DOIs | |
Publication status | Published - 1991 Jul |
Externally published | Yes |
Keywords
- Multilayers
- TEM
- magnetic properties
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry