Abstract
We have studied the epitaxial growth and structural properties of single crystal Mn/Ag multilayers grown on (001) GaAs substrates using transmission electron microscopy. A buffer layer of Ag (001) was grown on a 5 monolayer Fe seed layer on the (001) GaAs substrate before the growth of the multilayers to obtain good quality films. Mn/Ag multilayers show very sharp and coherent interfaces for Mn layer thicknesses up to ≈ 14 monolayers. The structure of Mn in Mn/Ag multilayers depends on the thickness of the Mn layer. An fcc precursor structure of Mn is proposed with a lattice parameter of 3.94A and is expected to be antiferromagnetic.
| Original language | English |
|---|---|
| Pages (from-to) | 719-722 |
| Number of pages | 4 |
| Journal | Journal of Electronic Materials |
| Volume | 20 |
| Issue number | 10 |
| Publication status | Published - 1991 Oct 1 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy (miscellaneous)