In order to reach high quality of organic thin films such as high mobility for device applications, it is strongly desirable to study the growth properties of pentacene film as a function of evaporation conditions. Here, we report the structure and morphology of thermal evaporated pentacene thin film by Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), and X-ray diffractometry (XRD) as a function of the evaporation rate and substrate temperature. These results play a key role in determining the electrical performance of organic thin film transistor devices.
|Journal of the Korean Physical Society
|Published - 2003 Feb
|Proceedings of The 11th Seoul International Symposium on the Physics of Semiconductors and Apllications - 2002 - Cheju Island, Korea, Republic of
Duration: 2002 Aug 20 → 2002 Aug 23
- Vacuum-evaporated pentacene
ASJC Scopus subject areas
- General Physics and Astronomy