Study on electrode design of PDP-like X-ray detector for enhancement of charge multiplication

In this article, a two-dimensional detector based on plasma display technology was investigated as a candidate for a flat-panel radiation detector. By using the three-dimensional Garfield code, the dependence of the electric field and multiplication on various electrode structures was examined. Based on the calculation of multiplication, three different electrode designs, including CAC, ridged CAC, and double-ridged CAC structures were selected and prototype detectors adopting these designs were fabricated and tested. The performance of these detectors was evaluated by measuring the charge density and sensitivity. The charge density of the double-ridged CAC detector during the X-ray for the on condition varied from 0.482 up to 2.59 μC/^cm2 at the address bias scope of -500 - 1500V, while the cathode voltage was locked at - 400 V. The sensitivity of the same detector was 0.596 nC/mR.cm² in an electric field of 0.54 V/μm, which was the highest value. This was about one-third lower than the sensitivity of the amorphous selenium (a-Se) based detector at 10 V/μm.