Study on thermal annealing of cadmium zinc telluride (CZT) crystals

G. Yang, A. E. Bolotnikov, P. M. Fochuk, G. S. Camarda, Y. Cui, A. Hossain, K. Kim, J. Horace, B. McCall, R. Gul, L. Xu, O. V. Kopach, R. B. James

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)


Cadmium Zinc Telluride (CZT) has attracted increasing interest with its promising potential as a room-temperature nuclear-radiation-detector material. However, different defects in CZT crystals, especially Te inclusions and dislocations, can degrade the performance of CZT detectors. Post-growth annealing is a good approach potentially to eliminate the deleterious influence of these defects. At Brookhaven National Laboratory (BNL), we built up different facilities for investigating post-growth annealing of CZT. Here, we report our latest experimental results. Cd-vapor annealing reduces the density of Te inclusions, while large temperature gradient promotes the migration of small-size Te inclusions. Simultaneously, the annealing lowers the density of dislocations. However, only-Cd-vapor annealing decreases the resistivity, possibly reflecting the introduction of extra Cd in the lattice. Subsequent Te-vapor annealing is needed to ensure the recovery of the resistivity after removing the Te inclusions.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XII
Publication statusPublished - 2010
Externally publishedYes
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XII - San Diego, CA, United States
Duration: 2010 Aug 22010 Aug 4

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherHard X-Ray, Gamma-Ray, and Neutron Detector Physics XII
Country/TerritoryUnited States
CitySan Diego, CA


  • CZT
  • Te inclusions
  • annealing
  • dislocations
  • radiation detection

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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