Abstract
The accuracy of the half-life measurement of short-lived radioisotopes such as positron-emitting 18F (τ1/2 ≈ 100min) is limited mainly by inaccuracies in the detector counting statistics. Gamma-ray measurement with a high-activity 18F source requires counting-loss corrections to compensate for random summing effects and the detector's dead time. In this study, we measure the half-life of 18F with two 511-keV γ-rays using two high-purity germanium (HPGe) detectors. The counting-loss corrections are performed via two approaches to address the problems of random coincidence summing and dead time: a half-life measurement with a 22Na source and a Geant4 simulation of the detector response. Variations in the full-width at half maximum (FWHM) of the 511-keV peak are found to show good correlation with the random summing effect. The half-life of 18F is estimated as 109.73±0.14min.
Original language | English |
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Pages (from-to) | 7-10 |
Number of pages | 4 |
Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 801 |
DOIs | |
Publication status | Published - 2015 Nov 21 |
Bibliographical note
Funding Information:This work was supported by a Korea University Grant .
Publisher Copyright:
© 2015 Elsevier B.V. All rights reserved.
Keywords
- Coincidence measurement
- Dead time correction
- F
- HPGe detector
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation