Superpixel-based depth image super-resolution

Yongseok Soh, Jae Young Sim, Chang-Su Kim, Sang Uk Lee

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    13 Citations (Scopus)

    Abstract

    Due to the development of depth sensors, such as time-of-flight (ToF) cameras, it becomes easier to acquire depth information directly from a scene. Although such devices enable us to obtain depth maps at video frame rates, the depth maps often have low resolutions only. A typical ToF camera retrieves depth maps of resolution 320 × 200, which is much lower than the resolutions of high definition color images. In this work, we propose a depth image super-resolution algorithm, which operates robustly even when there is a large resolution gap between a depth image and a reference color image. To prevent edge smoothing artifacts, which are the main drawback of conventional techniques, we adopt a superpixel-based approach and develop an edge enhancing scheme. Simulation results demonstrate that the proposed algorithm aligns the edges of a depth map to accurately coincide with those of a high resolution color image.

    Original languageEnglish
    Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Three-Dimensional Image Processing (3DIP) and Applications II
    DOIs
    Publication statusPublished - 2012
    Event3-Dimensional Image Processing (3DIP) and Applications II - Burlingame, CA, United States
    Duration: 2012 Jan 242012 Jan 26

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume8290
    ISSN (Print)0277-786X

    Other

    Other3-Dimensional Image Processing (3DIP) and Applications II
    Country/TerritoryUnited States
    CityBurlingame, CA
    Period12/1/2412/1/26

    Keywords

    • Depth image
    • Depth map super-resolution
    • Image interpolation
    • Superpixel

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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