Surface potential analysis of nanoscale biomaterials and devices using Kelvin probe force microscopy

  • Hyungbeen Lee
  • , Wonseok Lee
  • , Jeong Hoon Lee*
  • , Dae Sung Yoon
  • *Corresponding author for this work

    Research output: Contribution to journalReview articlepeer-review

    60 Citations (Scopus)

    Abstract

    In recent years, Kelvin probe force microscopy (KPFM) has emerged as a versatile toolkit for exploring electrical properties on a broad range of nanobiomaterials and molecules. An analysis using KPFM can provide valuable sample information including surface potential and work function of a certain material. Accordingly, KPFM has been widely used in the areas of material science, electronics, and biomedical science. In this review, we will briefly explain the setup of KPFM and its measuring principle and then survey representative results of various KPFM applications ranging from material analysis to device analysis. Finally, we will discuss some possibilities of KPFM on whether it is applicable to various sensor systems. Our perspective shed unique light on how KPFM can be used as a biosensor as well as equipment to measure electrical properties of materials and to recognize various molecular interactions.

    Original languageEnglish
    Article number4209130
    JournalJournal of Nanomaterials
    Volume2016
    DOIs
    Publication statusPublished - 2016

    Bibliographical note

    Publisher Copyright:
    © 2016 Hyungbeen Lee et al.

    ASJC Scopus subject areas

    • General Materials Science

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