Abstract
The p-type InP:Zn epilayers were prepared by using metal-organic chemical vapor deposition, and Mn was subsequently deposited onto the epilayer by using molecular beam epitaxy. The p-type InMnP:Zn epilayers were annealed at relatively low temperatures of 200-350 °C and contained no secondary phases such as InMn, MnP, and MnO2, as verified by x-ray diffraction. However, minute presence of MnO2 was confirmed using transmission electron microscopy, which agreed with the magnetic properties measured by using a superconducting quantum interference device (SQUID). From the SQUID measurements, consistent and systematic ferromagnetic properties with clear ferromagnetic hysteresis loops were observed. The Curie temperature, T C, which persisted up to ∼ 180 K, was recorded depending on the Mn concentrations and annealing temperature. These results indicate that the ferromagnetic semiconductor InMnP:Zn can be fabricated at a very low annealing temperature without forming ferromagnetic precipitates except for MnO2.
Original language | English |
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Pages (from-to) | 2158-2164 |
Number of pages | 7 |
Journal | Journal of the Korean Physical Society |
Volume | 63 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2013 |
Bibliographical note
Funding Information:This research was supported by the Leading Foreign Research Institute Recruitment Program (grant no. NRF-2012-00109) and the Basic Science Research Program (grant nos. KRF-2008-313-C00264 and 2013R1A1A2008875) through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (MEST).
Keywords
- Chemical vapor deposition (CVD)
- InP
- Molecular beam epitaxy (MBE)
- Semiconductors
ASJC Scopus subject areas
- General Physics and Astronomy