Texturing and electrical characteristics of solgel derived ferroelectric thin films

Kwangsoo No; Chang Jung Kim; Dae Sung Yoon; Joon Sung; Chaun Gi Choi; Won Jong Lee; Byeong Soo Bae

doi:10.1080/10584589508012920

Texturing and electrical characteristics of solgel derived ferroelectric thin films

Kwangsoo No, Chang Jung Kim, Dae Sung Yoon, Joon Sung, Chaun Gi Choi, Won Jong Lee, Byeong Soo Bae

Research output: Contribution to journal › Article › peer-review

Abstract

Highly oriented PZT, PLZT and PMN thin films were fabricated on various substrates using solgel method. The thin films having different orientation were fabricated by different drying conditions for pyrolysis. The preferred orientations of the PZT, PLZT and PMN thin films were observed using XRD(X-ray diffraction). The hysteresis loops, capacitance-voltage, and fatigue characteristics of the films were investigated using an RT66A standardized ferroelectric test system. The dielectric constant and current-voltage characteristics of the films were investigated using impedance analyzer and pA meter, respectively. The films oriented in particular direction showed better electrical characteristics to the randomly oriented films.

Original language	English
Pages (from-to)	159-168
Number of pages	10
Journal	Integrated Ferroelectrics
Volume	9
Issue number	1-3
DOIs	https://doi.org/10.1080/10584589508012920
Publication status	Published - 1995 Jun

ASJC Scopus subject areas

Control and Systems Engineering
Electronic, Optical and Magnetic Materials
Ceramics and Composites
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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10.1080/10584589508012920

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title = "Texturing and electrical characteristics of solgel derived ferroelectric thin films",

abstract = "Highly oriented PZT, PLZT and PMN thin films were fabricated on various substrates using solgel method. The thin films having different orientation were fabricated by different drying conditions for pyrolysis. The preferred orientations of the PZT, PLZT and PMN thin films were observed using XRD(X-ray diffraction). The hysteresis loops, capacitance-voltage, and fatigue characteristics of the films were investigated using an RT66A standardized ferroelectric test system. The dielectric constant and current-voltage characteristics of the films were investigated using impedance analyzer and pA meter, respectively. The films oriented in particular direction showed better electrical characteristics to the randomly oriented films.",

author = "Kwangsoo No and Kim, {Chang Jung} and Yoon, {Dae Sung} and Joon Sung and Choi, {Chaun Gi} and Lee, {Won Jong} and Bae, {Byeong Soo}",

year = "1995",

month = jun,

doi = "10.1080/10584589508012920",

language = "English",

volume = "9",

pages = "159--168",

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issn = "1058-4587",

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T1 - Texturing and electrical characteristics of solgel derived ferroelectric thin films

AU - No, Kwangsoo

AU - Kim, Chang Jung

AU - Yoon, Dae Sung

AU - Sung, Joon

AU - Choi, Chaun Gi

AU - Lee, Won Jong

AU - Bae, Byeong Soo

PY - 1995/6

Y1 - 1995/6

N2 - Highly oriented PZT, PLZT and PMN thin films were fabricated on various substrates using solgel method. The thin films having different orientation were fabricated by different drying conditions for pyrolysis. The preferred orientations of the PZT, PLZT and PMN thin films were observed using XRD(X-ray diffraction). The hysteresis loops, capacitance-voltage, and fatigue characteristics of the films were investigated using an RT66A standardized ferroelectric test system. The dielectric constant and current-voltage characteristics of the films were investigated using impedance analyzer and pA meter, respectively. The films oriented in particular direction showed better electrical characteristics to the randomly oriented films.

AB - Highly oriented PZT, PLZT and PMN thin films were fabricated on various substrates using solgel method. The thin films having different orientation were fabricated by different drying conditions for pyrolysis. The preferred orientations of the PZT, PLZT and PMN thin films were observed using XRD(X-ray diffraction). The hysteresis loops, capacitance-voltage, and fatigue characteristics of the films were investigated using an RT66A standardized ferroelectric test system. The dielectric constant and current-voltage characteristics of the films were investigated using impedance analyzer and pA meter, respectively. The films oriented in particular direction showed better electrical characteristics to the randomly oriented films.

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M3 - Article

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VL - 9

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EP - 168

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

IS - 1-3

ER -

Texturing and electrical characteristics of solgel derived ferroelectric thin films

Abstract

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