Abstract
We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip's apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.
Original language | English |
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Pages | 511-515 |
Number of pages | 5 |
DOIs | |
Publication status | Published - 2004 |
Externally published | Yes |
Event | 2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004 - Anaheim, CA, United States Duration: 2004 Nov 13 → 2004 Nov 19 |
Other
Other | 2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004 |
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Country/Territory | United States |
City | Anaheim, CA |
Period | 04/11/13 → 04/11/19 |
Keywords
- Atomic Force Microscopy (AFM)
- Blunt tip
- Carbon nanotube (CNT)
- Dielectrophoresis
- Electrophoresis
ASJC Scopus subject areas
- Mechanical Engineering
- Electrical and Electronic Engineering