The attachment of carbon nanotube on a blunt AFM tip using electric fields

Hyung Woo Lee; Soon Geun Kwon; Soo Hyun Kim; Yoon Keun Kwak; Chang Soo Han

doi:10.1115/IMECE2004-61549

The attachment of carbon nanotube on a blunt AFM tip using electric fields

Hyung Woo Lee, Soon Geun Kwon, Soo Hyun Kim, Yoon Keun Kwak, Chang Soo Han

Research output: Contribution to conference › Paper › peer-review

Abstract

We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip's apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.

Original language	English
Pages	511-515
Number of pages	5
DOIs	https://doi.org/10.1115/IMECE2004-61549
Publication status	Published - 2004
Externally published	Yes
Event	2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004 - Anaheim, CA, United States Duration: 2004 Nov 13 → 2004 Nov 19

Other

Other	2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004
Country/Territory	United States
City	Anaheim, CA
Period	04/11/13 → 04/11/19

Keywords

Atomic Force Microscopy (AFM)
Blunt tip
Carbon nanotube (CNT)
Dielectrophoresis
Electrophoresis

ASJC Scopus subject areas

Mechanical Engineering
Electrical and Electronic Engineering

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10.1115/IMECE2004-61549

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title = "The attachment of carbon nanotube on a blunt AFM tip using electric fields",

abstract = "We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip's apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.",

keywords = "Atomic Force Microscopy (AFM), Blunt tip, Carbon nanotube (CNT), Dielectrophoresis, Electrophoresis",

author = "Lee, {Hyung Woo} and Kwon, {Soon Geun} and Kim, {Soo Hyun} and Kwak, {Yoon Keun} and Han, {Chang Soo}",

year = "2004",

doi = "10.1115/IMECE2004-61549",

language = "English",

pages = "511--515",

note = "2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004 ; Conference date: 13-11-2004 Through 19-11-2004",

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T1 - The attachment of carbon nanotube on a blunt AFM tip using electric fields

AU - Lee, Hyung Woo

AU - Kwon, Soon Geun

AU - Kim, Soo Hyun

AU - Kwak, Yoon Keun

AU - Han, Chang Soo

PY - 2004

Y1 - 2004

N2 - We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip's apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.

AB - We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip's apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.

KW - Atomic Force Microscopy (AFM)

KW - Blunt tip

KW - Carbon nanotube (CNT)

KW - Dielectrophoresis

KW - Electrophoresis

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DO - 10.1115/IMECE2004-61549

M3 - Paper

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EP - 515

T2 - 2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004

Y2 - 13 November 2004 through 19 November 2004

ER -

The attachment of carbon nanotube on a blunt AFM tip using electric fields

Abstract

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Keywords

ASJC Scopus subject areas

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