The degradation of multi-crystalline silicon solar cells after damp heat tests

Wonwook Oh; Seongtak Kim; Soohyun Bae; Nochang Park; Yoon Mook Kang; Hae Seok Lee; Donghwan Kim

doi:10.1016/j.microrel.2014.07.071

The degradation of multi-crystalline silicon solar cells after damp heat tests

Wonwook Oh, Seongtak Kim, Soohyun Bae, Nochang Park, Yoon Mook Kang, Hae Seok Lee, Donghwan Kim

Research output: Contribution to journal › Article › peer-review

24 Citations (Scopus)

Abstract

Lower performance of multi-crystalline silicon solar cells is usually observed after long-term damp heat test at 85 °C/85% relative humidity. Performance degradation is known to result from the loss in fill factor (FF) due to high series resistance. The causes of the increase in the series resistance are the reduction of the photovoltaic (PV) ribbon in the solder joint and the oxidation of surface on the front Ag finger by high thermal and moisture stress. Additionally, severe degradation by FF loss after damp heat originated from the contact resistance between Si and Ag fingers. Ag crystallites on Si wafer and bulk Ag at the edge of the Ag finger were partially oxidized and could not play a role in the current path of photo-generated electrons.

Original language	English
Pages (from-to)	2176-2179
Number of pages	4
Journal	Microelectronics Reliability
Volume	54
Issue number	9-10
DOIs	https://doi.org/10.1016/j.microrel.2014.07.071
Publication status	Published - 2014 Sept 1

Bibliographical note

Funding Information:
This work was supported by the Human Resources Development program (No. 20124030200120 ) of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Korea government Ministry of Trade, Industry and Energy . This work was supported by the New & Renewable Energy (No. 20123030010080 ) of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Korea government Ministry of Trade, Industry and Energy .

Publisher Copyright:
© 2014 Elsevier Ltd. All rights reserved.

Keywords

Contact resistance
Corrosion
Damp heat test
Degradation
Photovoltaic module

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Safety, Risk, Reliability and Quality
Condensed Matter Physics
Surfaces, Coatings and Films
Electrical and Electronic Engineering

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1016/j.microrel.2014.07.071

Cite this

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title = "The degradation of multi-crystalline silicon solar cells after damp heat tests",

abstract = "Lower performance of multi-crystalline silicon solar cells is usually observed after long-term damp heat test at 85 °C/85% relative humidity. Performance degradation is known to result from the loss in fill factor (FF) due to high series resistance. The causes of the increase in the series resistance are the reduction of the photovoltaic (PV) ribbon in the solder joint and the oxidation of surface on the front Ag finger by high thermal and moisture stress. Additionally, severe degradation by FF loss after damp heat originated from the contact resistance between Si and Ag fingers. Ag crystallites on Si wafer and bulk Ag at the edge of the Ag finger were partially oxidized and could not play a role in the current path of photo-generated electrons.",

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AU - Park, Nochang

AU - Kang, Yoon Mook

AU - Lee, Hae Seok

AU - Kim, Donghwan

N1 - Funding Information: This work was supported by the Human Resources Development program (No. 20124030200120 ) of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Korea government Ministry of Trade, Industry and Energy . This work was supported by the New & Renewable Energy (No. 20123030010080 ) of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Korea government Ministry of Trade, Industry and Energy . Publisher Copyright: © 2014 Elsevier Ltd. All rights reserved.

PY - 2014/9/1

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N2 - Lower performance of multi-crystalline silicon solar cells is usually observed after long-term damp heat test at 85 °C/85% relative humidity. Performance degradation is known to result from the loss in fill factor (FF) due to high series resistance. The causes of the increase in the series resistance are the reduction of the photovoltaic (PV) ribbon in the solder joint and the oxidation of surface on the front Ag finger by high thermal and moisture stress. Additionally, severe degradation by FF loss after damp heat originated from the contact resistance between Si and Ag fingers. Ag crystallites on Si wafer and bulk Ag at the edge of the Ag finger were partially oxidized and could not play a role in the current path of photo-generated electrons.

AB - Lower performance of multi-crystalline silicon solar cells is usually observed after long-term damp heat test at 85 °C/85% relative humidity. Performance degradation is known to result from the loss in fill factor (FF) due to high series resistance. The causes of the increase in the series resistance are the reduction of the photovoltaic (PV) ribbon in the solder joint and the oxidation of surface on the front Ag finger by high thermal and moisture stress. Additionally, severe degradation by FF loss after damp heat originated from the contact resistance between Si and Ag fingers. Ag crystallites on Si wafer and bulk Ag at the edge of the Ag finger were partially oxidized and could not play a role in the current path of photo-generated electrons.

KW - Contact resistance

KW - Corrosion

KW - Damp heat test

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KW - Photovoltaic module

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The degradation of multi-crystalline silicon solar cells after damp heat tests

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

UN SDGs

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