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The effect of annealing on amorphous indium gallium zinc oxide thin film transistors
- H. S. Bae
- , J. H. Kwon
- , S. Chang
- , M. H. Chung
- , T. Y. Oh
- , J. H. Park
- , S. Y. Lee
- , B. K. Ju
Research output: Contribution to conference › Paper › peer-review