The effect of frequency of electromagnetic vibration on the primary silicon size in hypereutectic Al-Si alloy

E. P. Yoon, J. P. Choi, J. P. Park, K. B. Kim, W. Y. Yoon, M. H. Kim, K. H. Kim, T. W. Nam

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    In this study, the electromagnetic vibration is adopted for control of the size of primary Si phase. The higher the current density and frequency of electromagnetic vibration (EMV), the finer the size of primary Si phase. The higher the current density but the lower frequency of EMV, the bigger the size of primary Si phase. This phenomenon considered to be related the collision, agglomeration and diffusion of silicon atoms.

    Original languageEnglish
    Pages (from-to)413-416
    Number of pages4
    JournalMaterials Science Forum
    Volume475-479
    Issue numberI
    DOIs
    Publication statusPublished - 2005
    EventPRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China
    Duration: 2004 Nov 22004 Nov 5

    Keywords

    • Al-Si
    • Aluminum alloy
    • Electromagnetic force
    • Primary Silicon
    • Vibration

    ASJC Scopus subject areas

    • General Materials Science
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering

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