Abstract
Moisture can diffuse into a photovoltaic (PV) module through its breathable back-sheet and its ethylene vinyl acetate (EVA) sheet. Therefore moisture-induced degradation mechanism is investigated with multi-crystalline (m-Si) silicon PV module. Three types of accelerated tests (ATs) were conducted to evaluate the effect of temperature and humidity on the degradation of m-Si PV module. The thermal activation energy for degradation, 0.492 eV, was calculated. Electroluminescence image shows that moisture has an effect on the module degradation. Electrical measurements, Dark IV and Suns Voc indicate that series resistance (Rs) contributes to drop in power output. The results of SEM&EDX and Auger Electron Spectroscopy (AES) reveal that corrosion occurred at the region of solder joint and also show that the oxide concentration on the metal electrode increased after the AT.
Original language | English |
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Pages (from-to) | 1823-1827 |
Number of pages | 5 |
Journal | Microelectronics Reliability |
Volume | 53 |
Issue number | 9-11 |
DOIs | |
Publication status | Published - 2013 Sept |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Safety, Risk, Reliability and Quality
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering