The Influence of Capping Layers on Tunneling Magnetoresistance and Microstructure in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions upon Annealing

Geunwoo Kim, Soogil Lee*, Sanghwa Lee, Byonggwon Song, Byung Kyu Lee, Duhyun Lee, Jin Seo Lee, Min Hyeok Lee, Young Keun Kim, Byong Guk Park*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'The Influence of Capping Layers on Tunneling Magnetoresistance and Microstructure in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions upon Annealing'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science