Abstract
This paper introduces a practical power supply design method for the display panel of smartphone. The specific goal of this design method is to reduce the voltage stress over the internal MOSFET of the power supply for more reliable operation. A power integrity analysis is conducted to evaluate a factor which increases the voltage stress over the internal MOSFET. Based on this analysis, two PCB layouts are designed for case studies. Reduced voltage stress is verified in the case study.
| Original language | English |
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| Title of host publication | 2016 IEEE International Conference on Consumer Electronics, ICCE 2016 |
| Editors | Francisco J. Bellido, Nicholas C. H. Vun, Carsten Dolar, Daniel Diaz-Sanchez, Wing-Kuen Ling |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 123-124 |
| Number of pages | 2 |
| ISBN (Electronic) | 9781467383646 |
| DOIs | |
| Publication status | Published - 2016 Mar 10 |
| Event | 2016 IEEE International Conference on Consumer Electronics, ICCE 2016 - Las Vegas, United States Duration: 2016 Jan 7 → 2016 Jan 11 |
Publication series
| Name | 2016 IEEE International Conference on Consumer Electronics, ICCE 2016 |
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Conference
| Conference | 2016 IEEE International Conference on Consumer Electronics, ICCE 2016 |
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| Country/Territory | United States |
| City | Las Vegas |
| Period | 16/1/7 → 16/1/11 |
Bibliographical note
Publisher Copyright:© 2016 IEEE.
ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering