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The Schottky-Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening
Soohyung Park, Thorsten Schultz, Dongguen Shin, Niklas Mutz, Areej Aljarb, Hee Seong Kang, Chul Ho Lee, Lain Jong Li, Xiaomin Xu, Vincent Tung, Emil J.W. List-Kratochvil, Sylke Blumstengel, Patrick Amsalem, Norbert Koch
Research output: Contribution to journal › Article › peer-review
10
Citations
(Scopus)