The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy

Jinsung Park; Doyeon Bang; Kuewhan Jang; Seungjoo Haam; Jaemoon Yang; Sungsoo Na

doi:10.1088/0957-4484/23/36/365705

The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy

Jinsung Park, Doyeon Bang, Kuewhan Jang, Seungjoo Haam, Jaemoon Yang, Sungsoo Na

Research output: Contribution to journal › Article › peer-review

27 Citations (Scopus)

Abstract

The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.

Original language	English
Article number	365705
Journal	Nanotechnology
Volume	23
Issue number	36
DOIs	https://doi.org/10.1088/0957-4484/23/36/365705
Publication status	Published - 2012 Sept 14

ASJC Scopus subject areas

Bioengineering
Chemistry(all)
Materials Science(all)
Mechanics of Materials
Mechanical Engineering
Electrical and Electronic Engineering

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abstract = "The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.",

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AU - Yang, Jaemoon

AU - Na, Sungsoo

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N2 - The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.

AB - The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.

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The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy

Abstract

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