The X-ray sensitivity is one of the important parameters indicating the detector performance. The X-ray sensitivity of semi-insulating polycrystalline CdZnTe:Cl thick films was investigated as a function of electric field, mean photon energy, film thickness, and charge carrier transport parameters and, compared with another promising detector materials. The X-ray sensitivities of the polycrystalline CdZnTe films with 350 μm thickness were about 2.2 and 6.2 μC/cm2/R in the ohmic-type and Schottky-type detector at 0.83 V/μm, respectively.
|Number of pages
|Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
|Published - 2008 Jun 11
Bibliographical noteFunding Information:
The work was supported by the second Brain Korea 21 Program endorsed by the Korea Ministry of Education.
- Charge carrier transport
- Polycrystalline CdZnTe thick films
- X-ray sensitivity
ASJC Scopus subject areas
- Nuclear and High Energy Physics