TY - JOUR
T1 - The X-ray sensitivity of semi-insulating polycrystalline CdZnTe thick films
AU - Won, Jae Ho
AU - Kim, Ki Hyun
AU - Suh, Jong Hee
AU - Cho, Shin Hang
AU - Cho, Pyong Kon
AU - Hong, Jin Ki
AU - Kim, Sun Ung
N1 - Funding Information:
The work was supported by the second Brain Korea 21 Program endorsed by the Korea Ministry of Education.
PY - 2008/6/11
Y1 - 2008/6/11
N2 - The X-ray sensitivity is one of the important parameters indicating the detector performance. The X-ray sensitivity of semi-insulating polycrystalline CdZnTe:Cl thick films was investigated as a function of electric field, mean photon energy, film thickness, and charge carrier transport parameters and, compared with another promising detector materials. The X-ray sensitivities of the polycrystalline CdZnTe films with 350 μm thickness were about 2.2 and 6.2 μC/cm2/R in the ohmic-type and Schottky-type detector at 0.83 V/μm, respectively.
AB - The X-ray sensitivity is one of the important parameters indicating the detector performance. The X-ray sensitivity of semi-insulating polycrystalline CdZnTe:Cl thick films was investigated as a function of electric field, mean photon energy, film thickness, and charge carrier transport parameters and, compared with another promising detector materials. The X-ray sensitivities of the polycrystalline CdZnTe films with 350 μm thickness were about 2.2 and 6.2 μC/cm2/R in the ohmic-type and Schottky-type detector at 0.83 V/μm, respectively.
KW - Charge carrier transport
KW - Polycrystalline CdZnTe thick films
KW - X-ray sensitivity
UR - http://www.scopus.com/inward/record.url?scp=44649145366&partnerID=8YFLogxK
U2 - 10.1016/j.nima.2008.03.057
DO - 10.1016/j.nima.2008.03.057
M3 - Article
AN - SCOPUS:44649145366
SN - 0168-9002
VL - 591
SP - 206
EP - 208
JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
IS - 1
ER -