Thickness effects of SiOxNy, interlayer inserted between BaTiO3 insulating layer and ZnS:Mn phosphor layer in thin film electroluminescent devices

M. H. Song, Y. H. Lee, T. S. Hahn, M. H. Oh, K. H. Yoon

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Thickness effects of SiOxNy, interlayer inserted between BaTiO3 insulating layer and ZnS:Mn phosphor layer in thin film electroluminescent devices'. Together they form a unique fingerprint.

Keyphrases

Material Science

Engineering