Abstract
A third-order nonlinear model for organic light emitting diodes (OLEDs) is presented. The model can consistently describe dynamic and static characteristics of OLEDs. The model can also be used to estimate the physical characteristics of specific layers of an OLED. The parameters of the proposed model are estimated using a trust-region algorithm and a particle swarm optimization algorithm. Several of the resulting parameters relate to the electrical and light emission characteristics of OLEDs. Using only one set of experiments on an OLED device, a nonlinear model including all parameters, can be obtained; this method is highly advantageous for the fast quality control of OLEDs.
Original language | English |
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Pages (from-to) | 1503-1508 |
Number of pages | 6 |
Journal | Journal of Electrical Engineering and Technology |
Volume | 11 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2016 Sept |
Keywords
- Nondestructive testing
- Organic light-emitting diodes
- System identification
ASJC Scopus subject areas
- Electrical and Electronic Engineering