Abstract
Here, we report on high-performance top-gated poly(3,3‴-dialkyl- quarterthiophene) (PQT-12) organic thin-film transistors (OTFTs) with reverse-offset-printed (ROP) silver (Ag) source/drain (S/D) electrodes. OTFT devices with ROP S/D electrodes using Ag nanopaste show higher performance (∼0.01cm2/Vs) than those fabricated by vacuum electron beam evaporation with conventional photolithography and a standard lift-off process (∼1×10-3cm2/Vs). This dissimilarity is attributed to the higher work function (-4.9eV) of the ROP Ag electrode due to AgO formation on the Ag surface during thermal annealing. This results in a low interfacial hole injection energy barrier between the S/D electrodes and the PQT-12 semiconductor.
Original language | English |
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Article number | 133306 |
Journal | Applied Physics Letters |
Volume | 101 |
Issue number | 13 |
DOIs | |
Publication status | Published - 2012 Sept 24 |
Bibliographical note
Funding Information:This study was supported by the Development of New Materials and Solution Process for LCD Backplanes funded by ISTK (B551179-09-06-00), Basic Science Research Program, through the National Research Foundation of Korea (NRF), funded by the Ministry of Education, Science and Technology (2010-0015035), by the Development of printing ink for touch panels and OLED lighting (A2010D-D006), funded by the Ministry of Knowledge Economy (MKE) and Daedeok innopolis, by the IT R&D Program (Grant No. 2008-F-024-02, Development of Mobile Flexible (Input/Output Platform) MKE, and by the IT R&D Infrastructure Program supervised by the NIPA (National IT Industry Promotion Agency) (NIPA-2011-(B1110-1101-0002) MKE in Korea. The authors would like to thank Ph. D. Jeong, Hu Young in UNIST Central Research Facilities for the preparation of transmission electron microscope.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)