Transitional analysis of organic thin color filter layers in displays during baking process using multi-speckle diffusing wave spectroscopy

Baek Sung Park; Kyung Hee Hyung; Gwi Jeong Oh; Hyun Wook Jung

doi:10.1007/s13367-018-0002-1

Transitional analysis of organic thin color filter layers in displays during baking process using multi-speckle diffusing wave spectroscopy

Baek Sung Park, Kyung Hee Hyung, Gwi Jeong Oh, Hyun Wook Jung

Department of Chemical and Biological Engineering

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The color filter (CF) is one of the key components for improving the performance of TV displays such as liquid crystal display (LCD) and white organic light emitting diodes (WOLED). The profile defects like undercut during the fine fabrication processes for CF layers are inevitably generated through the UV exposure and development processes, however, these can be controlled through the baking process. In order to resolve the profile defects of CF layers, in this study, the real-time dynamic changes of CF layers are monitored during the baking process by changing components such as polymeric binder and acrylate. The motion of pigment particles in CF layers during baking is quantitatively interpreted using multi-speckle diffusing wave spectroscopy (MSDWS), in terms of the autocorrelation function and the characteristic time of α-relaxation.

Original language	English
Pages (from-to)	11-19
Number of pages	9
Journal	Korea Australia Rheology Journal
Volume	30
Issue number	1
DOIs	https://doi.org/10.1007/s13367-018-0002-1
Publication status	Published - 2018 Feb 1

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) grants funded by the Korea government (MSIP) (NRF-2016R1A5A1009592 and NRF-2017R1E1A1A01075107).

Publisher Copyright:
© 2018, Korean Society of Rheology (KSR) and the Australian Society of Rheology (ASR) and Springer-Verlag GmbH Germany, part of Springer Nature.

Keywords

CF layer
baking process
displays
multi-speckle diffusing wave spectroscopy
rheology
undercut

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics

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10.1007/s13367-018-0002-1

Cite this

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title = "Transitional analysis of organic thin color filter layers in displays during baking process using multi-speckle diffusing wave spectroscopy",

abstract = "The color filter (CF) is one of the key components for improving the performance of TV displays such as liquid crystal display (LCD) and white organic light emitting diodes (WOLED). The profile defects like undercut during the fine fabrication processes for CF layers are inevitably generated through the UV exposure and development processes, however, these can be controlled through the baking process. In order to resolve the profile defects of CF layers, in this study, the real-time dynamic changes of CF layers are monitored during the baking process by changing components such as polymeric binder and acrylate. The motion of pigment particles in CF layers during baking is quantitatively interpreted using multi-speckle diffusing wave spectroscopy (MSDWS), in terms of the autocorrelation function and the characteristic time of α-relaxation.",

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AU - Jung, Hyun Wook

N1 - Funding Information: This work was supported by the National Research Foundation of Korea (NRF) grants funded by the Korea government (MSIP) (NRF-2016R1A5A1009592 and NRF-2017R1E1A1A01075107). Publisher Copyright: © 2018, Korean Society of Rheology (KSR) and the Australian Society of Rheology (ASR) and Springer-Verlag GmbH Germany, part of Springer Nature.

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Transitional analysis of organic thin color filter layers in displays during baking process using multi-speckle diffusing wave spectroscopy

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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