The color filter (CF) is one of the key components for improving the performance of TV displays such as liquid crystal display (LCD) and white organic light emitting diodes (WOLED). The profile defects like undercut during the fine fabrication processes for CF layers are inevitably generated through the UV exposure and development processes, however, these can be controlled through the baking process. In order to resolve the profile defects of CF layers, in this study, the real-time dynamic changes of CF layers are monitored during the baking process by changing components such as polymeric binder and acrylate. The motion of pigment particles in CF layers during baking is quantitatively interpreted using multi-speckle diffusing wave spectroscopy (MSDWS), in terms of the autocorrelation function and the characteristic time of α-relaxation.
Bibliographical noteFunding Information:
This work was supported by the National Research Foundation of Korea (NRF) grants funded by the Korea government (MSIP) (NRF-2016R1A5A1009592 and NRF-2017R1E1A1A01075107).
© 2018, Korean Society of Rheology (KSR) and the Australian Society of Rheology (ASR) and Springer-Verlag GmbH Germany, part of Springer Nature.
- CF layer
- baking process
- multi-speckle diffusing wave spectroscopy
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics