Abstract
Microstructural and chemical properties of screen-printed Ag contacts on an n+ emitter surface in crystalline Si solar cells are investigated using a transmission electron microscope. The Pb-based glass layer, where many Ag precipitates are randomly distributed, is formed between a Ag thick film and textured Si. For both textured and nontextured Si surfaces, the Ag crystallites are epitaxially grown on Si with an abrupt interface along the {111} atomic plane. Based on high resolution electron microscopy images combined with fast Fourier transform patterns, the registry of Ag on Si driven by a geometrical matching condition leads to minimization of the effective lattice mismatch between Ag and Si, resulting in the formation of a Ag/Si epitaxial superlattice near the interface region.
Original language | English |
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Pages (from-to) | H934-H936 |
Journal | Journal of the Electrochemical Society |
Volume | 157 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2010 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Materials Chemistry
- Surfaces, Coatings and Films
- Electrochemistry
- Renewable Energy, Sustainability and the Environment