Ultrafast optical wide field microscopy

M. Seo; S. Boubanga-Tombet; J. Yoo; Z. Ku; A. V. Gin; S. T. Picraux; S. R.J. Brueck; A. J. Taylor; R. P. Prasankumar

doi:10.1364/OE.21.008763

Ultrafast optical wide field microscopy

M. Seo^*
, S. Boubanga-Tombet
, J. Yoo
, Z. Ku
, A. V. Gin
, S. T. Picraux
, S. R.J. Brueck
, A. J. Taylor
, R. P. Prasankumar

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.

Original language	English
Pages (from-to)	8763-8772
Number of pages	10
Journal	Optics Express
Volume	21
Issue number	7
DOIs	https://doi.org/10.1364/OE.21.008763
Publication status	Published - 2013 Apr 8
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1364/OE.21.008763

Cite this

@article{f9bfc594f2294a77adc8d68e131d0b2d,

title = "Ultrafast optical wide field microscopy",

abstract = "We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.",

author = "M. Seo and S. Boubanga-Tombet and J. Yoo and Z. Ku and Gin, \{A. V.\} and Picraux, \{S. T.\} and Brueck, \{S. R.J.\} and Taylor, \{A. J.\} and Prasankumar, \{R. P.\}",

year = "2013",

month = apr,

day = "8",

doi = "10.1364/OE.21.008763",

language = "English",

volume = "21",

pages = "8763--8772",

journal = "Optics Express",

issn = "1094-4087",

publisher = "Optica Publishing Group (formerly OSA)",

number = "7",

}

TY - JOUR

T1 - Ultrafast optical wide field microscopy

AU - Seo, M.

AU - Boubanga-Tombet, S.

AU - Yoo, J.

AU - Ku, Z.

AU - Gin, A. V.

AU - Picraux, S. T.

AU - Brueck, S. R.J.

AU - Taylor, A. J.

AU - Prasankumar, R. P.

PY - 2013/4/8

Y1 - 2013/4/8

N2 - We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.

AB - We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.

UR - https://www.scopus.com/pages/publications/84875973345

U2 - 10.1364/OE.21.008763

DO - 10.1364/OE.21.008763

M3 - Article

C2 - 23571965

AN - SCOPUS:84875973345

SN - 1094-4087

VL - 21

SP - 8763

EP - 8772

JO - Optics Express

JF - Optics Express

IS - 7

ER -

Ultrafast optical wide field microscopy

Abstract

ASJC Scopus subject areas

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