Abstract
We fabricated point-contacted a-Si:H(p)/c-Si(n) heterojunction solar cells using patterned SiO2 and investigated their electrical properties using the light current-voltage (I-V) curve and Suns-Voc measurements. The light I-V curves showed bias-dependent changes according to the applied voltage in the point-contacted cells, especially in the samples with a long distance between the point-contacted junctions. The Suns-Voc measurements showed that the bias-dependence of the light I-V curves did not originate from the recombination in the SiO2/Si or a-Si:H(p)/c-Si(n) interface, but from the series resistances. It is possible to explain the bias-dependent light I-V curve in terms of the conductivity of a-Si:H(p) and difference in the electrical contact properties between a-Si:H(p), ZnO and c-Si(n). These results mean that the electrical properties of the a-Si:H(p) layer and the contact properties with this layer are also critical to obtain a high Jsc and fill factor in n-type based Si heterojunction solar cells.
Original language | English |
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Pages (from-to) | 1186-1190 |
Number of pages | 5 |
Journal | Current Applied Physics |
Volume | 9 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2009 Nov |
Bibliographical note
Funding Information:This work was supported by the Korea Research Foundation Grant funded by the Korean Government (MOEHRD- KRF 2007-357-D00154). The authors would like to thank Prof. Andres Cuevas, Dr. Daniel Macdonald and Dr. Jason Tan, Department of Engineering in the Australian National University, for the measurement and discussion of Suns-V oc .
Keywords
- Heterojunction
- I-V analysis
- Solar cells
- a-Si/c-Si
ASJC Scopus subject areas
- General Materials Science
- General Physics and Astronomy