Abstract
We demonstrated the improved performance of near UV (365 nm) InGaN/AlGaN-based LEDs using highly reflective Al-based p-type reflectors with graphene sheets as a diffusion barrier. The use of graphene sheets did not degrade the reflectance of ITO/Al contacts, viz. ∼81% at 365 nm. The ITO/graphene/Al contacts annealed at 300 °C exhibited better ohmic behavior with a specific contact resistance of 1.5 × 10-3 Ωcm 2 than the ITO/Al contact (with 9.5 × 10-3 Ωcm2). Near UV LEDs fabricated with the ITO/graphene/Al contact annealed at 300 °C showed a 7.2% higher light output (at 0.1 W) than LEDs with the ITO/Al reflector annealed at 300 °C. The SIMS results exhibited that, unlike the ITO/graphene/Al, the ITO/Al contacts undergo a significant indiffusion of Al atoms toward the GaN after annealing. Furthermore, both Ga and Mg atoms were also more extensively outdiffused in the ITO/Al contacts after annealing. On the basis of the SIMS and electrical results, the possible explanations for the annealing-induced degradation of the ITO/Al contacts are described and discussed.
Original language | English |
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Pages (from-to) | 1176-1180 |
Number of pages | 5 |
Journal | Current Applied Physics |
Volume | 14 |
Issue number | 9 |
DOIs | |
Publication status | Published - 2014 Sept |
Bibliographical note
Funding Information:This work was supported by the Industrial Strategic Technology Development Program , 10041878 , Development of WPE 75% LED device process and standard evaluation technology funded by the MKE, Korea .
Keywords
- Graphene
- ITO/Al
- Reflector
- UV light emitting diode
ASJC Scopus subject areas
- General Materials Science
- General Physics and Astronomy