Vacuum null-point scanning thermal microscopy: Simultaneous quantitative nanoscale mapping of undisturbed temperature and thermal resistance

  • Juhang Cha
  • , Hwijong Shin
  • , Ohmyoung Kwon*
    • *Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    8 Citations (Scopus)

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    Engineering

    Material Science