Vanishing skyrmion Hall effect at the angular momentum compensation temperature of a ferrimagnet

Yuushou Hirata, Duck Ho Kim, Se Kwon Kim, Dong Kyu Lee, Se Hyeok Oh, Dae Yun Kim, Tomoe Nishimura, Takaya Okuno, Yasuhiro Futakawa, Hiroki Yoshikawa, Arata Tsukamoto, Yaroslav Tserkovnyak, Yoichi Shiota, Takahiro Moriyama, Sug Bong Choe, Kyung Jin Lee, Teruo Ono

Research output: Contribution to journalArticlepeer-review

109 Citations (Scopus)

Abstract

In the presence of a magnetic field, the flow of charged particles in a conductor is deflected from the direction of the applied force, which gives rise to the ordinary Hall effect. Analogously, moving skyrmions with non-zero topological charges and finite fictitious magnetic fields exhibit the skyrmion Hall effect, which is detrimental for applications such as skyrmion racetrack memory. It was predicted that the skyrmion Hall effect vanishes for antiferromagnetic skyrmions because their fictitious magnetic field, proportional to net spin density, is zero. Here we investigate the current-driven transverse elongation of pinned ferrimagnetic bubbles. We estimate the skyrmion Hall effect from the angle between the current and the bubble elongation directions. The angle and, hence, the skyrmion Hall effect vanishes at the angular momentum compensation temperature where the net spin density vanishes. Furthermore, our study establishes a direct connection between the fictitious magnetic field and the spin density.

Original languageEnglish
Pages (from-to)232-236
Number of pages5
JournalNature Nanotechnology
Volume14
Issue number3
DOIs
Publication statusPublished - 2019 Mar 1

ASJC Scopus subject areas

  • Bioengineering
  • Atomic and Molecular Physics, and Optics
  • Biomedical Engineering
  • Materials Science(all)
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Vanishing skyrmion Hall effect at the angular momentum compensation temperature of a ferrimagnet'. Together they form a unique fingerprint.

Cite this