Variations in minority carrier-trapping effects caused by hydrogen passivation in multicrystalline silicon wafer

Yujin Jung, Kwan Hong Min, Soohyun Bae, Yoonmook Kang, Donghwan Kim, Hae Seok Lee

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Mathematics

Engineering & Materials Science