Visual tracking using pertinent patch selection and masking

Dae Youn Lee, Jae Young Sim, Chang-Su Kim

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    39 Citations (Scopus)

    Abstract

    A novel visual tracking algorithm using patch-based appearance models is proposed in this paper. We first divide the bounding box of a target object into multiple patches and then select only pertinent patches, which occur repeatedly near the center of the bounding box, to construct the foreground appearance model. We also divide the input image into non-overlapping blocks, construct a background model at each block location, and integrate these background models for tracking. Using the appearance models, we obtain an accurate foreground probability map. Finally, we estimate the optimal object position by maximizing the likelihood, which is obtained by convolving the foreground probability map with the pertinence mask. Experimental results demonstrate that the proposed algorithm outperforms state-of-the-art tracking algorithms significantly in terms of center position errors and success rates.

    Original languageEnglish
    Title of host publicationProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
    PublisherIEEE Computer Society
    Pages3486-3493
    Number of pages8
    ISBN (Electronic)9781479951178, 9781479951178
    DOIs
    Publication statusPublished - 2014 Sept 24
    Event27th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014 - Columbus, United States
    Duration: 2014 Jun 232014 Jun 28

    Publication series

    NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
    ISSN (Print)1063-6919

    Other

    Other27th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014
    Country/TerritoryUnited States
    CityColumbus
    Period14/6/2314/6/28

    Bibliographical note

    Publisher Copyright:
    © 2014 IEEE.

    ASJC Scopus subject areas

    • Software
    • Computer Vision and Pattern Recognition

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