TY - JOUR
T1 - Wavelength calibration of dispersive near-infrared spectrometer using relative k-space distribution with low coherence interferometer
AU - Kim, Ji Hyun
AU - Han, Jae Ho
AU - Jeong, Jichai
N1 - Funding Information:
This research was supported in part by a Korea University Grant, the Brain Korea 21 PLUS Program through the National Research Foundation of Korea funded by the Ministry of Education , and by the Basic Science Research Program through the National Research Foundation of Korea ( 2013R1A1A2062448 ).
Publisher Copyright:
© 2016 Elsevier B.V. All rights reserved.
PY - 2016/5/15
Y1 - 2016/5/15
N2 - The commonly employed calibration methods for laboratory-made spectrometers have several disadvantages, including poor calibration when the number of characteristic spectral peaks is low. Therefore, we present a wavelength calibration method using relative k-space distribution with low coherence interferometer. The proposed method utilizes an interferogram with a perfect sinusoidal pattern in k-space for calibration. Zero-crossing detection extracts the k-space distribution of a spectrometer from the interferogram in the wavelength domain, and a calibration lamp provides information about absolute wavenumbers. To assign wavenumbers, wavelength-to-k-space conversion is required for the characteristic spectrum of the calibration lamp with the extracted k-space distribution. Then, the wavelength calibration is completed by inverse conversion of the k-space into wavelength domain. The calibration performance of the proposed method was demonstrated with two experimental conditions of four and eight characteristic spectral peaks. The proposed method elicited reliable calibration results in both cases, whereas the conventional method of third-order polynomial curve fitting failed to determine wavelengths in the case of four characteristic peaks. Moreover, for optical coherence tomography imaging, the proposed method could improve axial resolution due to higher suppression of sidelobes in point spread function than the conventional method. We believe that our findings can improve not only wavelength calibration accuracy but also resolution for optical coherence tomography.
AB - The commonly employed calibration methods for laboratory-made spectrometers have several disadvantages, including poor calibration when the number of characteristic spectral peaks is low. Therefore, we present a wavelength calibration method using relative k-space distribution with low coherence interferometer. The proposed method utilizes an interferogram with a perfect sinusoidal pattern in k-space for calibration. Zero-crossing detection extracts the k-space distribution of a spectrometer from the interferogram in the wavelength domain, and a calibration lamp provides information about absolute wavenumbers. To assign wavenumbers, wavelength-to-k-space conversion is required for the characteristic spectrum of the calibration lamp with the extracted k-space distribution. Then, the wavelength calibration is completed by inverse conversion of the k-space into wavelength domain. The calibration performance of the proposed method was demonstrated with two experimental conditions of four and eight characteristic spectral peaks. The proposed method elicited reliable calibration results in both cases, whereas the conventional method of third-order polynomial curve fitting failed to determine wavelengths in the case of four characteristic peaks. Moreover, for optical coherence tomography imaging, the proposed method could improve axial resolution due to higher suppression of sidelobes in point spread function than the conventional method. We believe that our findings can improve not only wavelength calibration accuracy but also resolution for optical coherence tomography.
KW - Biomedical imaging
KW - Infrared spectroscopy
KW - Optical coherence tomography
KW - Optical imaging
UR - http://www.scopus.com/inward/record.url?scp=84955443110&partnerID=8YFLogxK
U2 - 10.1016/j.optcom.2016.01.046
DO - 10.1016/j.optcom.2016.01.046
M3 - Article
AN - SCOPUS:84955443110
SN - 0030-4018
VL - 367
SP - 186
EP - 191
JO - Optics Communications
JF - Optics Communications
ER -