X-Ray Fluorescence Imaging Based on CdTe Detector Array for Analysis of Various Materials

Ajin Jo, Wonho Lee

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


An X-ray fluorescence (XRF) imaging system was developed to analyze various materials based on characteristic X-rays emitted from objects exposed to X-ray flux. The XRF system can be used in various industrial fields, such as nuclear fuel analysis, to guarantee combustion stability in the nuclear reactor, glazed material analysis to preserve and restore ceramic cultural assets, impurity measurements in electronic circuits, and so on. In this study, we built an XRF imaging system and performed several material analyses using a lookup table, which contained energy and channel information of the characteristic X-ray peaks of each element. Ceramic specimens coated in various glazes were analyzed and imaged for oriental pottery research. Pigments of various colors were also analyzed and imaged for picture assessment, as were electronic circuits and gold plates. Ceramic, pigment, and metal components in the samples were discriminated by comparing characteristic X-ray peak data on the lookup table. Two-dimensional material images, which showed the material distribution of each sample, were successfully obtained.

Original languageEnglish
Article number9250582
Pages (from-to)2523-2534
Number of pages12
JournalIEEE Transactions on Nuclear Science
Issue number12
Publication statusPublished - 2020 Dec

Bibliographical note

Funding Information:
Manuscript received August 7, 2020; accepted October 28, 2020. Date of publication November 6, 2020; date of current version December 16, 2020. This work was supported in part by the Nuclear Safety Research Program through the Korea Foundation of Nuclear Safety (KoFONS) using the financial resource granted by the Nuclear Safety and Security Commission (NSSC) of the Republic of Korea under Grant 1903006 and in part by the National Research Foundation of Korea (NRF) granted by the Ministry of Science and ICT (MSIT) of the Republic of Korea under Grant 2020R1A2C1005924.

Publisher Copyright:
© 1963-2012 IEEE.


  • Material analysis
  • X-ray fluorescence (XRF) imaging system
  • nondestructive testing system

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering


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