X-Ray Fluorescence Imaging Based on CdTe Detector Array for Analysis of Various Materials

Ajin Jo, Wonho Lee

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    An X-ray fluorescence (XRF) imaging system was developed to analyze various materials based on characteristic X-rays emitted from objects exposed to X-ray flux. The XRF system can be used in various industrial fields, such as nuclear fuel analysis, to guarantee combustion stability in the nuclear reactor, glazed material analysis to preserve and restore ceramic cultural assets, impurity measurements in electronic circuits, and so on. In this study, we built an XRF imaging system and performed several material analyses using a lookup table, which contained energy and channel information of the characteristic X-ray peaks of each element. Ceramic specimens coated in various glazes were analyzed and imaged for oriental pottery research. Pigments of various colors were also analyzed and imaged for picture assessment, as were electronic circuits and gold plates. Ceramic, pigment, and metal components in the samples were discriminated by comparing characteristic X-ray peak data on the lookup table. Two-dimensional material images, which showed the material distribution of each sample, were successfully obtained.

    Original languageEnglish
    Article number9250582
    Pages (from-to)2523-2534
    Number of pages12
    JournalIEEE Transactions on Nuclear Science
    Volume67
    Issue number12
    DOIs
    Publication statusPublished - 2020 Dec

    Bibliographical note

    Funding Information:
    Manuscript received August 7, 2020; accepted October 28, 2020. Date of publication November 6, 2020; date of current version December 16, 2020. This work was supported in part by the Nuclear Safety Research Program through the Korea Foundation of Nuclear Safety (KoFONS) using the financial resource granted by the Nuclear Safety and Security Commission (NSSC) of the Republic of Korea under Grant 1903006 and in part by the National Research Foundation of Korea (NRF) granted by the Ministry of Science and ICT (MSIT) of the Republic of Korea under Grant 2020R1A2C1005924.

    Publisher Copyright:
    © 1963-2012 IEEE.

    Keywords

    • Material analysis
    • X-ray fluorescence (XRF) imaging system
    • nondestructive testing system

    ASJC Scopus subject areas

    • Nuclear and High Energy Physics
    • Nuclear Energy and Engineering
    • Electrical and Electronic Engineering

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